Entwicklung eines Röntgenmikroskops für Photonenenergien von 15 keV bis 30 keV

In many research areas X-rays are used for analysis. In X-ray full field microscopy a high resolution is achievable independent of the source properties by using imaging lenses. With an objective lens with 100 mm focal length a theoretical resolution of 60nm is achievable at 30 keV. In Experiments a...

Ausführliche Beschreibung

Gespeichert in:
1. Verfasser:
Marschall, Felix (auth)
Format:
Elektronisch E-Book
Sprache:
Deutsch
Veröffentlicht:
KIT Scientific Publishing 2014
Zusammenfassung:
In many research areas X-rays are used for analysis. In X-ray full field microscopy a high resolution is achievable independent of the source properties by using imaging lenses. With an objective lens with 100 mm focal length a theoretical resolution of 60nm is achievable at 30 keV. In Experiments a resolution of 200 nm for a field of view of 80 µm
Umfang:
1 online resource (IX, 126 p. p.)
Anmerkungen:
German
ISBN:
1000043064
Schlagworte:
Technology: general issues
Bezugswerke: