Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 /

The DATE conference addresses all aspects of research into technologies for electronic and embedded system engineering It covers the design process, test, and automation tools for electronics ranging from integrated circuits to distributed embedded systems This includes both hardware and embedded so...

Ausführliche Beschreibung

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Weitere Titel:
Design, Automation & Test in Europe Conference & Exhibition
Körperschaft:
Institute of Electrical and Electronics Engineers (IEEE)
Format:
Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
Piscataway, New Jersey : Institute of Electrical and Electronics Engineers (IEEE), 2017.
Zusammenfassung:
The DATE conference addresses all aspects of research into technologies for electronic and embedded system engineering It covers the design process, test, and automation tools for electronics ranging from integrated circuits to distributed embedded systems This includes both hardware and embedded software design issues The conference scope also includes the elaboration of design requirements and new architectures for challenging application fields such as telecoms, wireless communications, multimedia, healthcare, smart energy and automotive systems Companies also present innovative industrial designs to foster the feedback from realworld design to research DATE also hosts a number of special sessions, events within the main technical programme such as panels, hot topic sessions, tutorials and workshops technical programme such as panels, hot topic sessions, tutorials and workshops.
Umfang:
1 online resource : illustrations
ISBN:
3-9815370-8-4
Schlagworte:
Computer-aided design > Congresses.
Electronic industries > Automation > Congresses.
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