2016 IEEE First International Conference on Control, Measurement and Instrumentation (CMI) /

CMI 2016 will be the first biennial flagship event of IEEE Joint CSS IMS Chapter, Kolkata Section, India This event will provide a global forum for academicians, researchers, industrial practitioners, scientists and engineers to discuss about their research endeavors, studies, findings, new ideas an...

Ausführliche Beschreibung

Gespeichert in:
Weitere Titel:
2016 IEEE First International Conference on Control, Measurement and Instrumentation
Körperschaft:
Institute of Electrical and Electronics Engineers
Format:
Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
Piscataway, NJ : IEEE, 2016.
Zusammenfassung:
CMI 2016 will be the first biennial flagship event of IEEE Joint CSS IMS Chapter, Kolkata Section, India This event will provide a global forum for academicians, researchers, industrial practitioners, scientists and engineers to discuss about their research endeavors, studies, findings, new ideas and concepts, contributions and developments related to the areas of control theories and applications, measurement theories and applications and instrumentation theories and applications CMI 2016 will comprise keynote and plenary sessions by eminent academicians, regular and poster sessions of contributed papers, special sessions and tutorial sessions All papers will undergo blind peer review process and the criteria for acceptance will be based on quality, originality, technical content and relevance.
Umfang:
1 online resource (513 pages)
ISBN:
1-4799-1769-9
Schlagworte:
Electronic instruments > Congresses.
Electronic instruments.
Bezugswerke:
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