2014 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, South Lake Tahoe, California, October 12-16, 2014 /

Gespeichert in:
Körperschaften:
International Integrated Reliability Workshop South Lake Tahoe, Calif., IEEE Electron Devices Society (sponsoring body.), IEEE Reliability Society (sponsoring body.)
Format:
Tagungsbericht Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
Piscataway, New Jersey : Institute of Electrical and Electronics Engineers, 2014.
Umfang:
1 online resource (57 pages)
ISBN:
1-4799-7274-6
Schlagworte:
Semiconductors > Reliability > Congresses.
Integrated circuits > Reliability > Congresses.
Bezugswerke:
Links: