VLSI Design and Test (VDAT), 2015 19th International Symposium on /

Annotation VLSI Design and Test Symposium (VDAT 2015) is nineteenth in the series of symposia which started in 1997 This annual event is devoted to design, test, fault tolerant computing and design of circuits and systems The idea behind VDAT Symposium is to promote R&D on all aspects of VLSI to...

Ausführliche Beschreibung

Gespeichert in:
Weitere Titel:
2015 19th International Symposium on VLSI Design and Test
VLSI Design and Test
Körperschaft:
Institute of Electrical and Electronics Engineers
Format:
Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
Piscataway, New Jersey : IEEE, 2015.
Zusammenfassung:
Annotation VLSI Design and Test Symposium (VDAT 2015) is nineteenth in the series of symposia which started in 1997 This annual event is devoted to design, test, fault tolerant computing and design of circuits and systems The idea behind VDAT Symposium is to promote R&D on all aspects of VLSI to act as a forum for free discussion on emerging topics of VLSI and related fields for academicians and professionals from India and abroad.
Umfang:
1 online resource (various pagings) : illustrations
ISBN:
9781479917433
1479917435
Schlagworte:
Integrated circuits > Congresses.
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