2013 8th IEEE Design and Test Symposium /

The International Design and Test Symposium explores emerging challenges and novel concepts in design, automation, test and reliability of electronic products ranging from integrated circuits through multi chip modules and printed circuit boards to full systems and microsystems IDT provides unique f...

Ausführliche Beschreibung

Gespeichert in:
Weitere Titel:
Design and Test Symposium
Körperschaft:
Institute of Electrical and Electronics Engineers (IEEE)
Format:
Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
Piscataway, New Jersey : Institute of Electrical and Electronics Engineers (IEEE), 2013.
Zusammenfassung:
The International Design and Test Symposium explores emerging challenges and novel concepts in design, automation, test and reliability of electronic products ranging from integrated circuits through multi chip modules and printed circuit boards to full systems and microsystems IDT provides unique forum to discuss best practices and novel ideas in design methods, tools, test and reliability in the Middle East and Africa (MEA) region.
Umfang:
1 online resource : illustrations
ISBN:
9781479935253
1479935255
Schlagworte:
Electronic circuit design > Congresses.
Integrated circuits > Testing > Congresses.
Electronic circuits > Testing > Congresses.
Bezugswerke:
Links: