2017 IEEE 26th Asian Test Symposium (ATS) /

The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world, especially from Asia, to exchange innovative ideas on system, board, and device testing with design, manufacturing and field consideration in mind.

Gespeichert in:
Weitere Titel:
2017 IEEE 26th Asian Test Symposium
Körperschaft:
Institute of Electrical and Electronics Engineers (IEEE)
Format:
Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
Piscataway, New Jersey : Institute of Electrical and Electronics Engineers (IEEE), 2017.
Zusammenfassung:
The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world, especially from Asia, to exchange innovative ideas on system, board, and device testing with design, manufacturing and field consideration in mind.
Umfang:
1 online resource : illustrations
ISBN:
9781538624371
1538624370
Schlagworte:
Electronic circuits > Testing > Congresses.
Fault-tolerant computing > Congresses.
Bezugswerke:
Links: