2017 XX IEEE International Conference on Soft Computing and Measurements (SCM) /

The conference will cover a broad area of Soft Computing, Measurement and Control of Complex Objects under Uncertainty.

Gespeichert in:
Weitere Titel:
2017 XX IEEE International Conference on Soft Computing and Measurements
Körperschaft:
Institute of Electrical and Electronics Engineers
Format:
Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
Piscataway, NJ : IEEE, 2017.
Zusammenfassung:
The conference will cover a broad area of Soft Computing, Measurement and Control of Complex Objects under Uncertainty.
Umfang:
1 online resource
ISBN:
1-5386-1810-9
Schlagworte:
Computer simulation > Congresses.
Uncertainty (Information theory) > Congresses.
Bezugswerke:
Links: