2017 IEEE International Reliability Physics Symposium (IRPS) /

Study of reliability as applied to semiconductor manufacturing, automotive, PV, and other engineering disciplines International participation.

Gespeichert in:
Weitere Titel:
2017 IEEE International Reliability Physics Symposium
Körperschaft:
Institute of Electrical and Electronics Engineers
Format:
Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
Piscataway, NJ : IEEE, 2017.
Zusammenfassung:
Study of reliability as applied to semiconductor manufacturing, automotive, PV, and other engineering disciplines International participation.
Umfang:
1 online resource (982 pages) : illustrations
ISBN:
1-5090-6641-1
Schlagworte:
Electronic apparatus and appliances > Reliability > Congresses.
Bezugswerke:
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