2023 IEEE 41st VLSI Test Symposium (VTS) : VTS 2023 : April 24th-26th, 2023, San Diego, CA, USA : proceedings /

The Premier IEEE Symposium will bring together scientists, academics, and practicing engineers from all over the world to explore emerging trends and novel concepts in testing, and verification & validation of microelectronic circuits and systems, the aim of this conference is to provide an inte...

Ausführliche Beschreibung

Gespeichert in:
Weitere Titel:
2023 IEEE 41st VLSI Test Symposium
Hauptverfasser:
Song, Peilin, Tahoori, Mehdi, Traiola, Marcello
Körperschaft:
IEEE VLSI Test Symposium
Format:
Tagungsbericht Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
Piscataway, NJ : IEEE, 2023.
Zusammenfassung:
The Premier IEEE Symposium will bring together scientists, academics, and practicing engineers from all over the world to explore emerging trends and novel concepts in testing, and verification & validation of microelectronic circuits and systems, the aim of this conference is to provide an international forum for these experts to promote, share, and discuss various issues and developments in the growing field of VLSI Test.
Umfang:
1 online resource : illustrations
Anmerkungen:
Includes index.
ISBN:
9798350346305
Schlagworte:
Integrated circuits > Very large scale integration > Testing > Congresses.
Bezugswerke:
Links: