25th IEEE VLSI Test Symposium (VTS 2007): Berkeley, California - 06-10 May 2007

Annotation VTS 2007 focuses on innovation in the field of testing of integrated circuits and systems. The core of VTS 2007 explores the many trends and challenges in the semiconductor design and manufacturing industries with papers covering a diverse and seminal set of topics including, RF and Analo...

Ausführliche Beschreibung

Gespeichert in:
Körperschaft:
Institute of Electrical and Electronics Engineers Computer Society Press
Format:
Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
[Place of publication not identified] IEEE Computer Society Press 2007
Zusammenfassung:
Annotation VTS 2007 focuses on innovation in the field of testing of integrated circuits and systems. The core of VTS 2007 explores the many trends and challenges in the semiconductor design and manufacturing industries with papers covering a diverse and seminal set of topics including, RF and Analog Test, Delay Test, Memory Test, Diagnosis, Online Test, SOC Test, and Fault Prediction and Evaluation. The proceedings features special sessions and covers innovative practices highlighting cutting-edge challenges faced by test practitioners and innovative solutions. Contents: RF Test; Delay Test Quality; Memory Test; Test Compression; Going after Defects; Online Test; Diagnosis; ATPG for Delay Faults; Advances in Test; Failure Estimation; Fault Prediction & Evaluation; Analog Test; High Level Test Techniques; Memory Repair; SOC Test; Design for Test; Testing Large Chips; Ensuring Secure Chips.
Umfang:
1 online resource (xxx, 484 pages) : illustrations
Anmerkungen:
Bibliographic Level Mode of Issuance: Monograph
Anmerkungen:
English
ISBN:
9781509090495
1509090495
Schlagworte:
Integrated circuits > Design and construction > Congresses.
Integrated circuits > Very large scale integration > Congresses.
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