2020 IEEE 29th Asian Test Symposium (ATS 2020) : proceedings : 22-25 November 2020, Malaysia /

Electronic test of devices, boards, and systems covering the complete test cycle from design verification,design for test, design for manufacturing, silicon debugging, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement.

Gespeichert in:
Weitere Titel:
2020 IEEE 29th Asian Test Symposium
Körperschaft:
IEEE Asian Test Symposium
Format:
Tagungsbericht Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
Piscataway, NJ : IEEE, 2020.
Zusammenfassung:
Electronic test of devices, boards, and systems covering the complete test cycle from design verification,design for test, design for manufacturing, silicon debugging, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement.
Umfang:
1 online resource (xl, 223 pages) : illustrations
Anmerkungen:
Includes index.
ISBN:
9781728174679
1728174678
Schlagworte:
Electronic digital computers > Circuits > Testing > Congresses.
Bezugswerke:
Links: