2020 IEEE Workshop Celebrating the Scientific Value of Failure : FailFest 2020 : proceedings : virtual event, 25 October 2020 /

VIS 2020 will be the year s premier forum for advances in theory, methods, and applications of visualization and visual analytics The conference will convene an international community of researchers and practitioners from universities, government, and industry to exchange recent findings on the des...

Ausführliche Beschreibung

Gespeichert in:
Weitere Titel:
2020 IEEE Workshop Celebrating the Scientific Value of Failure
Körperschaft:
Institute of Electrical and Electronics Engineers
Format:
Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
Piscataway, New Jersey : IEEE, [2020]
Zusammenfassung:
VIS 2020 will be the year s premier forum for advances in theory, methods, and applications of visualization and visual analytics The conference will convene an international community of researchers and practitioners from universities, government, and industry to exchange recent findings on the design and use of visualization tools We invite you to share your research, insights, and enthusiasm at IEEE Visual Analytics Science and Technology (VAST), IEEE Information Visualization (InfoVis), and IEEE Scientific Visualization (SciVis).
Umfang:
1 online resource (11 pages) : illustrations
Bibliografie:
Includes bibliographical references and index.
ISBN:
1-7281-8556-4
Schlagworte:
Failure (Psychology) > Congresses.
Bezugswerke:
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