APA-Zitierstil (7. Ausg.)

IEEE VLSI Test Symposium, IEEE VLSI Test Symposium Santa Cruz, Calif, Institute of Electrical and Electronics Engineers, IEEE Computer Society Test Technology Technical Committee, & IEEE VLSI Test Symposium. (2009). 2009 27th IEEE VLSI Test Symposium: Proceedings : 3-7 May 2009 Santa Cruz, CA, USA ; VTS 2009. IEEE Computer Society.

Chicago-Zitierstil (17. Ausg.)

IEEE VLSI Test Symposium, Calif IEEE VLSI Test Symposium Santa Cruz, Institute of Electrical and Electronics Engineers, IEEE Computer Society Test Technology Technical Committee, und IEEE VLSI Test Symposium. 2009 27th IEEE VLSI Test Symposium: Proceedings : 3-7 May 2009 Santa Cruz, CA, USA ; VTS 2009. [Place of publication not identified]: IEEE Computer Society, 2009.

MLA-Zitierstil (8. Ausg.)

IEEE VLSI Test Symposium, et al. 2009 27th IEEE VLSI Test Symposium: Proceedings : 3-7 May 2009 Santa Cruz, CA, USA ; VTS 2009. IEEE Computer Society, 2009.