2009 27th IEEE VLSI Test Symposium : proceedings : 3-7 May 2009 Santa Cruz, CA, USA ; VTS 2009

Gespeichert in:
Körperschaften:
IEEE VLSI Test Symposium (Corporate Author), IEEE VLSI Test Symposium Santa Cruz, Calif., Institute of Electrical and Electronics Engineers (Content Provider), IEEE Computer Society Test Technology Technical Committee (Content Provider)
Format:
Tagungsbericht Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
[Place of publication not identified] IEEE Computer Society 2009
Anmerkungen:
Bibliographic Level Mode of Issuance: Monograph
Anmerkungen:
English
ISBN:
9781509075676
1509075674
Schlagworte:
Integrated circuits > Very large scale integration > Testing > Congresses.
Electrical Engineering
Electrical & Computer Engineering
Engineering & Applied Sciences
Bezugswerke:
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