2006 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 16-19, 2006

Gespeichert in:
Körperschaften:
International Integrated Reliability Workshop (Corporate Author), International Integrated Reliability Workshop South Lake Tahoe, Calif., IEEE Reliability Society (Content Provider), IEEE Electron Devices Society (Content Provider)
Format:
Tagungsbericht Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
[Place of publication not identified] Electron Devices Society 2006
Anmerkungen:
Bibliographic Level Mode of Issuance: Monograph
Anmerkungen:
English
ISBN:
9781509090969
1509090967
9781424402977
1424402972
Schlagworte:
Integrated circuits > Reliability > Congresses.
Integrated circuits > Reliability > Wafer-scale integration > Congresses.
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Bezugswerke:
Links: