Asian Test Symposium, 2nd (ATS '93)

Proceedings of the 2nd Asian Test Symposium held in Beijing, China, in November 1993. Among the topics: fault tolerance, analog and mixed circuit testing, and testability analysis. No index. Annotation copyright by Book News, Inc., Portland, OR.

Gespeichert in:
Körperschaft:
Institute of Electrical and Electronics Engineers
Format:
Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
[Place of publication not identified] IEEE Computer Society Press 1993
Zusammenfassung:
Proceedings of the 2nd Asian Test Symposium held in Beijing, China, in November 1993. Among the topics: fault tolerance, analog and mixed circuit testing, and testability analysis. No index. Annotation copyright by Book News, Inc., Portland, OR.
Umfang:
1 online resource
Anmerkungen:
Bibliographic Level Mode of Issuance: Monograph
Anmerkungen:
English
Schlagworte:
Electronic circuits > Testing > Congresses.
Electronic digital computers > Circuits > Testing.
Bezugswerke: