24th IEEE VLSI Test Symposium (VTS 2006): 30 April - 04 May 2006/Berkeley, California

Annotation VTS 2006 focuses on innovation in the field of testing of integrated circuits and systems. VTS looks at the many trends and challenges in the semiconductor design and manufacturing industries with papers covering wide range of interests, including basic and continuing education for test p...

Ausführliche Beschreibung

Gespeichert in:
Körperschaft:
IEEE Computer Society
Format:
Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
[Place of publication not identified] IEEE Computer Society Press 2006
Zusammenfassung:
Annotation VTS 2006 focuses on innovation in the field of testing of integrated circuits and systems. VTS looks at the many trends and challenges in the semiconductor design and manufacturing industries with papers covering wide range of interests, including basic and continuing education for test professionals, the latest research developments, new directions and hot topics in test, and expert perspectives on current issues. The proceedings explores high speed interconnect testing, analog and mixed signal testing, delay testing, flash and memory testing, RF testing, yield analysis, nanoscale testing, IDDQ, MEMS, and wireless testing.
Umfang:
1 online resource
Anmerkungen:
Bibliographic Level Mode of Issuance: Monograph
Anmerkungen:
English
ISBN:
9781509098286
1509098283
Schlagworte:
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Testing > Congresses.
Bezugswerke:
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