5th International Symposium on Quality Electronic Design : proceedings : 22-24 March, 2004, San Jose, California

Gespeichert in:
Körperschaften:
International Symposium on Quality Electronic Design (Corporate Author), International Symposium on Quality Electronic Design San Jose, Calif., IEEE Electron Devices Society (Content Provider)
Format:
Tagungsbericht Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
[Place of publication not identified] IEEE Computer Society 2004
Anmerkungen:
Bibliographic Level Mode of Issuance: Monograph
Anmerkungen:
English
Schlagworte:
Integrated circuits > Very large scale integration > Reliability > Congresses.
Integrated circuits > Very large scale integration > Design and construction > Congresses.
Integrated circuits > Computer-aided design > Very large scale integration > Congresses.
Integrated circuits > Quality control > Very large scale integration > Testing > Congresses.
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Bezugswerke: