Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : SEMI-THERM proceedings 2003 : San Jose, CA, USA, March 11-13, 2003

Gespeichert in:
Weitere Titel:
Semiconductor Thermal Measurement and Management Symposium, 2003, Nineteenth Annual IEEE.
Körperschaften:
IEEE Semiconductor Thermal Measurement and Management Symposium (Corporate Author), IEEE Semiconductor Thermal Measurement and Management Symposium San Jose, Calif., IEEE Components, Hybrids, and Manufacturing Technology Society (Content Provider)
Format:
Tagungsbericht Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
[Place of publication not identified] IEEE 2003
Anmerkungen:
Bibliographic Level Mode of Issuance: Monograph
Anmerkungen:
English
ISSN:
1065-2221
Schlagworte:
Semiconductors > Thermal properties > Congresses.
Semiconductors > Cooling > Congresses.
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Bezugswerke:
Links: