Designing, testing, and diagnostics--join them : International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA

Gespeichert in:
Körperschaften:
International Test Conference (Corporate Author), International Test Conference Baltimore, Md., IEEE Computer Society Test Technology Technical Committee (Content Provider), Institute of Electrical and Electronics Engineers Philadelphia Section (Content Provider)
Format:
Tagungsbericht Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
[Place of publication not identified] The Conference 1993
Anmerkungen:
Bibliographic Level Mode of Issuance: Monograph
Anmerkungen:
English
Schlagworte:
Integrated circuits > Testing > Congresses.
Automatic test equipment > Congresses.
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Bezugswerke: