VLSI Test Symposium: Proceedings: IEEE VLSI Test Symposium (17th: 1999: Dana Point, CA

The theme of the April 1999 symposium "Scaling deeper to submicron: test technology challenges" reflects the issues being created by the move toward nanometer technologies. Many creative and novel ideas and approaches to the current and future electronic circuit testing-related problems ar...

Ausführliche Beschreibung

Gespeichert in:
1. Verfasser:
IEEE Staff (MitwirkendeR)
Körperschaft:
Institute of Electrical and Electronics Engineers
Format:
Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
[Place of publication not identified] IEEE Computer Society Press 1999
Zusammenfassung:
The theme of the April 1999 symposium "Scaling deeper to submicron: test technology challenges" reflects the issues being created by the move toward nanometer technologies. Many creative and novel ideas and approaches to the current and future electronic circuit testing-related problems are explored and analyzed in the 62 paper presentations. The paper sessions span key areas in testing, such as BIST, mixed signal test, Iddq test, diagnosis, validation /verification, boundary scan, memory test, delay test and ATPG. Other sessions on emerging areas include defect level test, testing high speed circuits, MEMS test, and high-level test techniques.
Umfang:
1 online resource (xxxii, 488 pages)
Anmerkungen:
Bibliographic Level Mode of Issuance: Monograph
Anmerkungen:
English
Schlagworte:
Integrated circuits > Congresses.
Bezugswerke: