New frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC

Gespeichert in:
Körperschaften:
International Test Conference (Corporate Author), International Test Conference Washington, D.C., IEEE Computer Society Test Technology Technical Committee (Content Provider), Institute of Electrical and Electronics Engineers Philadelphia Section (Content Provider)
Format:
Tagungsbericht Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
[Place of publication not identified] Computer Society Press of the IEEE 1988
Anmerkungen:
Bibliographic Level Mode of Issuance: Monograph
Anmerkungen:
English
ISSN:
2378-2250
Schlagworte:
Integrated circuits > Testing > Congresses.
Electronic digital computers > Testing > Circuits > Congresses.
Automatic test equipment > Congresses.
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Bezugswerke:
Links: