Asian Test Symposium, 3rd

The November 1994 symposium heard 62 papers on subjects related to testing and design for electronic devices, assemblies, and systems--more specifically: fault simulation, on-line testing, test pattern generation and parallel testing, diagnostics, supply current testing, fault modeling, design for t...

Ausführliche Beschreibung

Gespeichert in:
Körperschaft:
Institute of Electrical and Electronics Engineers
Format:
Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
[Place of publication not identified] IEEE Computer Society Press 1994
Zusammenfassung:
The November 1994 symposium heard 62 papers on subjects related to testing and design for electronic devices, assemblies, and systems--more specifically: fault simulation, on-line testing, test pattern generation and parallel testing, diagnostics, supply current testing, fault modeling, design for testability, built-in self test, and test cost reduction. No index. Annotation copyright by Book News, Inc., Portland, OR.
Umfang:
1 online resource
Anmerkungen:
Bibliographic Level Mode of Issuance: Monograph
Anmerkungen:
English
Schlagworte:
Electronic circuits > Testing.
Electronic digital computers > Circuits > Testing.
Bezugswerke: