Third International Conference on the Economics of Design, Test, and Manufacturing : proceedings, May 16-17, 1994, Austin, Texas

Gespeichert in:
Hauptverfasser:
Ambler, Tony (MitwirkendeR), Abadir, M.
Körperschaften:
International Conference on the Economics of Design, Test, and Manufacturing (Corporate Author), International Conference on the Economics of Design, Test, and Manufacturing Austin, Tex., IEEE Computer Society Test Technology Technical Committee (Content Provider)
Weitere Verfasser:
Abadir, M. (MitwirkendeR)
Format:
Tagungsbericht Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
[Place of publication not identified] IEEE Computer Society Press 1994
Anmerkungen:
Bibliographic Level Mode of Issuance: Monograph
Anmerkungen:
English
Schlagworte:
Electronic circuits > Costs > Congresses.
Electronic circuit design > Decision making > Congresses.
Electronic circuits > Testing > Costs > Congresses.
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Bezugswerke: