On-Line Testing Workshop (IOLTW 2000): 6th IEEE International

Presents 36 contributions from the July 2000 workshop addressing electronic engineering concerns in the testing of electronics systems for the prevention of field failures. Eleven sessions addressed topics such as fault tolerance and on-line testing for reconfigurable systems, reliability issues in...

Ausführliche Beschreibung

Gespeichert in:
Körperschaft:
IEEE Computer Society Staff (Corporate Author)
Format:
Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
[Place of publication not identified] IEEE Computer Society Press 2000
Zusammenfassung:
Presents 36 contributions from the July 2000 workshop addressing electronic engineering concerns in the testing of electronics systems for the prevention of field failures. Eleven sessions addressed topics such as fault tolerance and on-line testing for reconfigurable systems, reliability issues in nanometer technologies and radiation effects, fault injection, on-line current modeling, concurrent checking, built-in self testing, defect driven testing, self checking circuits and analog approaches, coding theory and applications, and fault tolerance and on-line testing in railway and industrial control. Annotation copyrighted by Book News, Inc., Portland, OR.
Umfang:
1 online resource (x, 220 pages) : illustrations
Anmerkungen:
Bibliographic Level Mode of Issuance: Monograph
Anmerkungen:
English
Bibliografie:
Includes bibliographical references and index.
Schlagworte:
Electronic circuit design.
Error-correcting codes (Information theory)
Bezugswerke: