IEEE VLSI Test Symposium Digest of Papers, 1992

Saved in:
Corporate Authors:
Institute of Electrical and Electronics Engineers, IEEE, Society Staff (Content Provider)
Format:
Electronic eBook
Language:
English
Published:
[Place of publication not identified] IEEE 1992
Physical Description:
1 online resource
Notes:
Bibliographic Level Mode of Issuance: Monograph
Notes:
English
Subjects:
Application-specific integrated circuits.
Related Issues: