21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : Arlington, Virginia, USA, October 4-6, 2006

Gespeichert in:
1. Verfasser:
Park, Nohpill
Körperschaften:
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Corporate Author), IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Arlington, Virginia, USA, IEEE Computer Society Fault-Tolerant Computing Technical Committee (Content Provider), IEEE Computer Society Test Technology Technical Committee (Content Provider)
Weitere Verfasser:
Park, Nohpill (MitwirkendeR)
Format:
Tagungsbericht Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
[Place of publication not identified] IEEE Computer Society Press 2006
Anmerkungen:
Bibliographic Level Mode of Issuance: Monograph
Anmerkungen:
English
ISBN:
9781509097937
1509097937
Schlagworte:
Integrated circuits > Design and construction > Very large scale integration > Congresses.
Fault-tolerant computing > Congresses.
Electrical & Computer Engineering
Electrical Engineering
Engineering & Applied Sciences
Bezugswerke:
Links: