21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : Arlington, Virginia, USA, October 4-6, 2006

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Main Author:
Park, Nohpill
Corporate Authors:
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Corporate Author), IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Arlington, Virginia, USA, IEEE Computer Society Fault-Tolerant Computing Technical Committee (Content Provider), IEEE Computer Society Test Technology Technical Committee (Content Provider)
Other Authors:
Park, Nohpill (Contributor)
Format:
Conference Proceeding Electronic eBook
Language:
English
Published:
[Place of publication not identified] IEEE Computer Society Press 2006
Notes:
Bibliographic Level Mode of Issuance: Monograph
Notes:
English
ISBN:
9781509097937
1509097937
Subjects:
Integrated circuits > Design and construction > Very large scale integration > Congresses.
Fault-tolerant computing > Congresses.
Electrical & Computer Engineering
Electrical Engineering
Engineering & Applied Sciences
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