2005 IEEE International Test Conference (ITC) : 8-10 November, 2005, Austin, TX

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Corporate Authors:
International Test Conference (Corporate Author), International Test Conference Austin, Texas., Institute of Electrical and Electronics Engineers (Content Provider)
Format:
Conference Proceeding Electronic eBook
Language:
English
Published:
[Place of publication not identified] Institute of Electrical and Electronics Engineers 2005
Notes:
Bibliographic Level Mode of Issuance: Monograph
Notes:
English
ISBN:
9781509097678
1509097678
Subjects:
Integrated circuits > Testing > Congresses.
Semiconductors > Testing > Congresses.
Electronics > Congresses.
Electrical Engineering
Electrical & Computer Engineering
Engineering & Applied Sciences
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