Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2007

Gespeichert in:
Hauptverfasser:
Radhakrishnan, M. K., Mahapatra, Souvik (MitwirkendeR)
Körperschaften:
International Symposium on the Physical & Failure Analysis of Integrated Circuits (Corporate Author), International Symposium on the Physical & Failure Analysis of Integrated Circuits Indian Institute of Science, IEEE Electron Devices Society (Content Provider), IEEE Reliability/CPMT/ED Singapore Chapter (Content Provider)
Weitere Verfasser:
Radhakrishnan, M. K. (MitwirkendeR)
Format:
Tagungsbericht Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
[Place of publication not identified] IEEE 2007
Anmerkungen:
Bibliographic Level Mode of Issuance: Monograph
Anmerkungen:
English
ISBN:
9781509085309
1509085300
Schlagworte:
Integrated circuits > Defects > Congresses.
Integrated circuits > Testing > Congresses.
Integrated circuits > Reliability > Congresses.
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Bezugswerke:
Links: