X-ray diffraction : modern experimental techniques /

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern sy...

Ausführliche Beschreibung

Gespeichert in:
1. Verfasser:
Seeck, Oliver H.
Weitere Verfasser:
Seeck, Oliver H. (HerausgeberIn)
Format:
Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
Boca Raton, Florida : Pan Stanford Publishing, 2014.
Ausgabe:
1st ed.
Zusammenfassung:
High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electr
Umfang:
1 online resource (438 p.)
Anmerkungen:
Description based upon print version of record.
Anmerkungen:
English
Bibliografie:
Includes bibliographical references at the end of each chapters.
ISBN:
0-429-07189-2
981-4303-59-3
9780429071898
Schlagworte:
Radiography, Industrial.
X-rays > Diffraction.
Nanostructured materials > Analysis.
Bezugswerke:
Links: