Soft errors : from particles to circuits /

This book addresses soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment. It details the physical mechanisms at the origin of soft errors and explains how to detect, characterize, and simulate these phenomena in electronic circuits. It offers a practi...

Ausführliche Beschreibung

Gespeichert in:
Hauptverfasser:
Autran, Jean-Luc, Munteanu, Daniela
Weitere Verfasser:
Iniewski, Krzysztof (HerausgeberIn)
Format:
Elektronisch E-Book
Sprache:
Englisch
Veröffentlicht:
Boca Raton, Florida : CRC Press : Taylor & Francis Group, [2015]
Ausgabe:
1st edition
Zusammenfassung:
This book addresses soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment. It details the physical mechanisms at the origin of soft errors and explains how to detect, characterize, and simulate these phenomena in electronic circuits. It offers a practical knowledge and state-of-the-art survey of instrumentation developments in the fields of environment characterization, particle detection, and real-time/accelerated soft error tests, as well as examines recent computational advances and modeling and simulation strategies for the soft error rate es
Umfang:
1 online resource (432 p.)
text file
Anmerkungen:
Description based upon print version of record.
Anmerkungen:
English
Bibliografie:
Includes bibliographical references.
ISBN:
1-351-83155-0
1-315-21566-7
1-4665-9084-X
9781315215662
Schlagworte:
Atmospheric radiation.
Cosmic rays.
Particles.
Bezugswerke:
Links: