APA-Zitierstil (7. Ausg.)

IEEE International Workshop on Current & Defect Based Testing Palm Springs, Calif. (2005). DBT 2005: Proceedings, 2005 IEEE International Workshop on Current and Defect Based Testing, 2005 : 1 May 2005. IEEE.

Chicago-Zitierstil (17. Ausg.)

IEEE International Workshop on Current & Defect Based Testing Palm Springs, Calif. DBT 2005: Proceedings, 2005 IEEE International Workshop on Current and Defect Based Testing, 2005 : 1 May 2005. New York: IEEE, 2005.

MLA-Zitierstil (8. Ausg.)

IEEE International Workshop on Current & Defect Based Testing Palm Springs, Calif. DBT 2005: Proceedings, 2005 IEEE International Workshop on Current and Defect Based Testing, 2005 : 1 May 2005. IEEE, 2005.